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Semiconductor
Silicon Wafer Manufacturing
Wafer Fabrication
Assembly, Test & Packaging
Failure Analysis/Reliability
Consumables & Accessories
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Petrochemical
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Technical Training
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Industrial Chemicals
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IT Solutions
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Intellectual Property
Failure Analysis/Reliabilty
Suss MicroTec
- Manual/ Semi-auto Probing System
FEI
- SEM/TEM/ESEM
- FIB/Dual Beam
Nippon Scientific Co
- RIE System
- Plastic Decapsulation System
- Curve Tracer
Sonoscan
Scanning Laser Acoustic Microscope
-C-Mode Scanning Acoustic Microscope
-Automated Acoustics Microscope (ICs)
EPM Test Inc
Memory Test System (Mosaid)
ISIS Sentronics
Wafer Inspection System
(Flatness / Mini-Bumps / Roughness)
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